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用不同敏化方法提高超速测试的故障覆盖率 预览 被引量:1

Improving Fault Coverage by Adopting Different Sensitization Criterion for Faster Than At-Speed Testing
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摘要 面向小时延缺陷(small delay detect,SDDs)的测试产生方法不仅要求测试产生算法复杂度低,还要尽可能地检测到小时延缺陷.超速测试避免了因测试最长敏化通路而带来的测试效率过低的问题,而且它要求测试向量按敏化通路时延进行分组,对每组分配一个合适的超速测试频率,再采用一种可快速、准确选择特定长度的路径选择方法来有效地提高测试质量.同时,文中首次通过优先选用单通路敏化标准对短通路进行检测,对关键通路有选择地进行非强健测试,相对采用单一的敏化方法,能以很小的时间代价提高含有小时延缺陷的结点的跳变时延故障覆盖率(TDF).在ISCAS'89基准电路中对小时延缺陷的检测结果表明:用不同敏化方法进行测试产生,能在低的cpu时间里取得更高的跳变时延故障覆盖率. Test generation method for the small delay defects (SDDs) not only requires low algorithm complexity,but also more possibility to detect small delay.Faster than at-speed testing avoids to detect the longest sensitization paths for poor efficiency.It requires test patterns to be delicately classified into groups according to the delay of sensitization paths,and each group is managed to be applied at certain clock frequency.Then it adopts a path selection method to identify a certain length of paths quickly and accurately,which can achieve high test quality.At the same time,the paper firstly proposed that choosing single path sensitization criterion for short paths and nonrobust sensitization criterion for the critical paths to test can improve transition delay fault coverage (TDF) of the nodes which contain small delay defects at the cost of a little of time compared with adopting single sensitization criterion.Experimental results on ISCAS' 89 benchmark circuits show that the proposed method can achieve higher transition delay fault coverage of SDDs with low CPU time.
作者 魏建龙 邝继顺 WEI Jian-long,KUANG Ji-shun( College of Information Science and Engineering, Hunan University,Changsha 410082,China)
出处 《计算机科学》 CSCD 北大核心 2014年第5期55-58,90共5页 Computer Science
基金 本文受国家自然科学基金项目(60673085,60773207)资助.
关键词 小时延缺陷 单通路敏化 非强健测试 跳变时延故障覆盖率 超速测试 Small delay detect Single sensitization criterion Nonrobust test Transition delay fault coverage Faster than at-speed testing
作者简介 魏建龙(1987-),男,硕士生,主要研究方向为集成电路测试、小时延缺陷测试 邝继顺(1959-),男,博士,教授,博士生导师,CCF高级会员,主要研究方向为容错计算、嵌入式等.
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