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超纳尺寸Au中孪晶界可逆迁移的原位电子显微学研究 预览

In-situ TEM study of reversible twin boundary migration in sub-5-nm Au nanocrystal
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摘要 本文利用原位高分辨透射电子显微术研究了尺寸<5 nm的超纳尺寸金属Au中的孪晶界的变形行为.研究表明,尺寸<5 nm的超纳尺寸金属Au中的孪晶界在循环载荷作用下发生可逆迁移.这一孪晶界可逆迁移行为作为超纳尺寸金属在循环载荷作用下的一种典型变形方式,有效提高了超纳尺寸金属的力学稳定性. Deformation of sub-5-nm Au nanorcystals containing twin boundaries (TBs)wasinvestigated by using in-situ atomic-resolution electron microscopy. Reversible TB migration was found in sub-5-nm nanocrystals during cyclic displacement induced by electron beam. This reversible TB migration, as a typical deformation mode of sub-5-nm nanocrystals under cyclic displacement, improved the mechanical stability of sub-5-nm nanocrystals.
作者 王春阳 杜奎 WANG Chun-yang;DU Kui(Shenyang National Laboratory for Materials Science, Institute of Metal Research, Chinese Academy of Sciences, Shenyang Liaoning 110016;University of Chinese Academy of Sciences,Beijing 100049,China)
出处 《电子显微学报》 CAS CSCD 北大核心 2019年第4期329-333,共5页 Journal of Chinese Electron Microscopy Society
基金 国家自然科学基金资助项目(No. 51771203).
关键词 孪晶界 纳米金属 晶界迁移 可逆 原位电子显微学 twin boundary nanometer-structured metal grain boundary migration reversible In-situ electron microscopy
作者简介 王春阳(1990-),男(汉族),湖北省人,博士研究生.E-mail:cywang14b@imr.ac.cn;通讯作者:杜奎(1971-),男(汉族),湖北省人,研究员.E-mail:kuidu@imr.ac.cn.
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