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Isostructural phase transition-induced bulk modulus multiplication in dopant-stabilized ZrO2 solid solution
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作者 王敏 +7 位作者 李晓东 李延春 张国召 刘才龙 赵琳 高春晓 韩永昊 《中国物理B:英文版》 SCIE EI CAS CSCD 2019年第7期396-401,共6页
The electrical transport properties and structures of Y2 O3/ZrO2 solid solution have been studied under high pressure up to 23.2 GPa by means of in situ impedance spectroscopy and x-ray diffraction(XRD) measurements.I... The electrical transport properties and structures of Y2 O3/ZrO2 solid solution have been studied under high pressure up to 23.2 GPa by means of in situ impedance spectroscopy and x-ray diffraction(XRD) measurements.In the impedance spectra, it can be found that the pressure-dependent resistance of Y2 O3/ZrO2 presents two different change trends before and after 13.3 GPa, but the crystal symmetry still remains stable in the cubic structure revealed by the XRD measurement and Rietveld refinement.The pressure dependence of the lattice constant and unit cell volume shows that the Y2 O3/ZrO2 solid solution undergoes an isostructural phase transition at 13.1 GPa, which is responsible for the abnormal change in resistance.By fitting the volume data with the Birch–Murnaghan equation of state, we found that the bulk modulus B0 of the Y2 O3/ZrO2 solid solution increases by 131.9% from 125.2 GPa to 290.3 GPa due to the pressure-induced isostructural phase transition. 展开更多
关键词 high pressure X-RAY DIFFRACTION crystal structure Y2O3/ZrO2
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